Disk on Module Hi-Speed DOM EDC8000 IDE 40Pin Vertical Wide temp
The Latest Generation Disk on Module with Outstanding Performance and Durability. Extremely light weight, reliable & performant, This new generation IDE Flash Module is the most flexible solution to provide reliable storage on space limited and hostile environnment.
Decreasing data access time and replacing any moving part from a traditional hard drive, the Flash Disk on Module fit the needs of a wide range of application.
Wide temp version -40c +85c
80MB/s Read 75MB/s Write
Fully support of PIO 0-4/Multiword DMA 0-2/Ultra DMA 0-6 modes
IDE Master/Slave select
Power Cable included
Static Wear-Leveling Function
Bad Block Management & Error-Correction Code
Available in 2GB to 16GB
100% Compatible with the Standard IDE ATA interface, this unit works exaclty like a standard hard drive but without any moving part, strongly increasing reliability and improving data access speed performance, without any noise.
Wide Temperature Operating Range -40c to +85c
Interface: 9 pims SD standard Interface
SLC NAND Flash Capacity:
Standard: 1GB, 2GB;
SDHC: 4GB, 64GB
Data transfer rate:
Sustain Write: 15Mbytes/s (MAX)
Error Correction Function: Buil-in
ECC corrects up to 28 bits per 1 KB
Insertion/removal: 15,000 Cycles
Dimension: 24x32x2.1mm (LxWxH)
Write Protect Switch: 1,000 cycles
Operating temperature: 0c to 70c celcius
Error Detection and Correction
Highly sophisticated Error Correction Code algorithms are implemented. The ECC unit consists of the Parity Unit (parity-byte generation) and the Syndrome Unit (syndrome-byte computation). This unit implements an algorithm that can correct 28 bits per 1 KB in an ECC block. Code-byte generation during write operations, as well as error detection during read operation, is implemented on the fly without any speed penalties.
Flash memory can be erased within a limited number of times. This number is called the erase cycle limit or write endurance limit and is defined by the flash array vendor. The erase cycle limit applies to each individual erase block in the flash device.
InnoDisk Industrial SD Card uses a wear-leveling algorithm to ensure that consecutive writes of a specific sector are not written physically to the same page and block in the flash. This spreads flash media usage evenly across all pages, thereby extending flash lifetime.
Bad Blocks Management
Bad Blocks are blocks that contain one or more invalid bits whose reliability are not guaranteed. The Bad Blocks may be presented while the SD is shipped, or may develop during the life time of the SD. The Bad Blocks will not exceed more than 3% of the total device volume. When the Bad Blocks is detected, it will be flagged, and not be used anymore. The SD implement Bad Blocks management, Bad Blocks replacement, Error Correct Code to avoid data error occurred. The functions will be enabled automatically to transfer data from Bad Blocks to spare blocks, and correct error bit.
Other models available ( Variation)
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